Abstract :
In this research, we consider the maximization of process capability as the criterion in product/process design that is used for selecting preferred design factor levels and propose several approaches for single and multiple response performance measure designs. All of these approaches assume that the relationship between a process performance measure and a set of design factors is represented via an estimate of a response surface function. In particular, we develop: (i) criteria for selecting an optimal design, which we call MCpk and MCpm; (ii) mathematical programming formulations for maximizing MCpk and MCpm, including formulations for maximizing the desirability index (Harrington, 1965) and for maximizing the standardized performance criteria (Barton and Tsui, 1991) as special cases of the formulation for maximizing MCpk; (iii) formulations for considering cost when maximizing MCpk and MCpm; (iv) a means for assessing propagation of error; (v) a robust design method for assessing design factor effects on residual variance; (vi) a means for assessing the optimality of a proposed solution; and (vii) an original application in the screening of printed circuit board panels.
