Title of article :
Study of hydrogenated nanoamorphous silicon(na-Si:H) thin film prepared by RF magnetron sputtering for graded optical band gap (Eopt g )
Author/Authors :
HUACONG YU?، نويسنده , , RONGQIANG CUI، نويسنده , , HE WANG، نويسنده , , HONG YANG، نويسنده , , BAICHUAN ZHAO، نويسنده , , ZHANXIA ZHAO، نويسنده , , DUNYI TANG، نويسنده , , SHUQUAN LIN، نويسنده , , FANYING MENG، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Pages :
4
From page :
1367
To page :
1370
Abstract :
The schematic of the energy band gap figure of the graded optical band gap (Eopt g ) in p-i-n layer in na-Si:H solar cells was given in the paper. The intrinsic hydrogenated nanoamorphous silicon(na-Si:H) thin films with the graded band gap as a function of depth through the films were prepared by varying the processing power, gas pressure, gas composition, and etc., We have carried out a investigation of the relationships between the Eopt g with the crystallization ratio (Xc) and the Eopt g with the nanocrystalline grain size (D) in na-Si:H thin films grown by PECVD on glass substrates through XRD, Raman scattering, transmission. The Eopt g increase with the decreases of the crystallization ratio (Xc) and the nanocrystalline grain size (D).The hydrogen dilution ratio is found to increase basically both the crystallization ratio (Xc) and the nanocrystalline grain size (D). Two relationships in na-Si:H are discussed by the etching effect of atomic hydrogen in the framework of the growth mechanism and the quantum size effect (QSE). C 2005 Springer Science + Business Media, Inc
Journal title :
Journal of Materials Science
Serial Year :
2005
Journal title :
Journal of Materials Science
Record number :
829633
Link To Document :
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