• Title of article

    The failure analyses on ZnO varistors used in high tension devices

  • Author/Authors

    M. A. RAM´IREZ?، نويسنده , , P. R. Bueno، نويسنده , , W. C. RIBEIRO، نويسنده , , J. A. VARELA، نويسنده , , D. A. BONETT، نويسنده , , J. M. VILLA، نويسنده , , M. A. MA´ RQUEZ، نويسنده , , C. R. ROJO، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2005
  • Pages
    6
  • From page
    5591
  • To page
    5596
  • Abstract
    The main purpose of this work is to evaluate the failure caused by electrical discharge on commercial ZnO varistor doped with oxide of Bi, Sb, Si, Cr, Co utilized in electric transmission systems. In order to observe the effect of electrical discharge over the microstructure and electrical properties of the varistors, two kinds of pulses were applied: long pulse (2000 ms) and short pulse (8/20 μs). In both cases, a decrease in grain size and increase in micropores and leakage current were observed. The degraded samples present oxygen defficiency mainly in the grain boundary and phase tranformation from the bismuth oxide phase. C 2005 Springer Science + Business Media, Inc.
  • Journal title
    Journal of Materials Science
  • Serial Year
    2005
  • Journal title
    Journal of Materials Science
  • Record number

    830339