Title of article :
The failure analyses on ZnO varistors used in high
tension devices
Author/Authors :
M. A. RAM´IREZ?، نويسنده , , P. R. Bueno، نويسنده , , W. C. RIBEIRO، نويسنده , , J. A. VARELA، نويسنده , , D. A. BONETT، نويسنده , , J. M. VILLA، نويسنده , , M. A. MA´ RQUEZ، نويسنده , , C. R. ROJO، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Abstract :
The main purpose of this work is to evaluate the failure caused by electrical discharge on
commercial ZnO varistor doped with oxide of Bi, Sb, Si, Cr, Co utilized in electric
transmission systems. In order to observe the effect of electrical discharge over the
microstructure and electrical properties of the varistors, two kinds of pulses were applied:
long pulse (2000 ms) and short pulse (8/20 μs). In both cases, a decrease in grain size and
increase in micropores and leakage current were observed. The degraded samples present
oxygen defficiency mainly in the grain boundary and phase tranformation from the
bismuth oxide phase. C 2005 Springer Science + Business Media, Inc.
Journal title :
Journal of Materials Science
Journal title :
Journal of Materials Science