Title of article :
The failure analyses on ZnO varistors used in high tension devices
Author/Authors :
M. A. RAM´IREZ?، نويسنده , , P. R. Bueno، نويسنده , , W. C. RIBEIRO، نويسنده , , J. A. VARELA، نويسنده , , D. A. BONETT، نويسنده , , J. M. VILLA، نويسنده , , M. A. MA´ RQUEZ، نويسنده , , C. R. ROJO، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2005
Pages :
6
From page :
5591
To page :
5596
Abstract :
The main purpose of this work is to evaluate the failure caused by electrical discharge on commercial ZnO varistor doped with oxide of Bi, Sb, Si, Cr, Co utilized in electric transmission systems. In order to observe the effect of electrical discharge over the microstructure and electrical properties of the varistors, two kinds of pulses were applied: long pulse (2000 ms) and short pulse (8/20 μs). In both cases, a decrease in grain size and increase in micropores and leakage current were observed. The degraded samples present oxygen defficiency mainly in the grain boundary and phase tranformation from the bismuth oxide phase. C 2005 Springer Science + Business Media, Inc.
Journal title :
Journal of Materials Science
Serial Year :
2005
Journal title :
Journal of Materials Science
Record number :
830339
Link To Document :
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