Title of article :
Thermal wave measurement of wet paint
film thickness
Author/Authors :
J. P. SARGENT?، نويسنده , , D. P. Almond، نويسنده , , N. GATHERCOLE، نويسنده ,
Issue Information :
دوهفته نامه با شماره پیاپی سال 2006
Abstract :
Thermal wave phase measurements are reported on the drying of wet paint films on aluminium
substrates. Measurements of the change in thickness as the paint dries have also been obtained
using a differential focussing technique on an optical microscope. By including the optical
microscope measurements of the drying paint film thickness together with estimates for the
density and thermal properties of the drying and cured paint, predictions have been made of
the thermal phase/thickness relationships for the wet, dry, curing and cured paints. It is
concluded that a phase measurement on the wet paints could be used to predict a final cured
paint thickness with an accuracy of approximately ±2 μm. Errors in predicting cured film
thickness from a wet film thermal phase measurement arises principally from uncertainty over
the solvent content of the wet paint film, the state of cure, and the consequent uncertainty over
the paint density and thermal properties. C 2006 Springer Science + Business Media, Inc.
Journal title :
Journal of Materials Science
Journal title :
Journal of Materials Science