Title of article
Combined Rietveld refinement of CaMgSi2O6:Eu2+ using X-ray and neutron powder diffraction data
Author/Authors
Yong-Il Kim، نويسنده , , WON BIN IM، نويسنده , , DUK YOUNG JEON، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2006
Pages
5
From page
1643
To page
1647
Journal title
Journal of Materials Science
Serial Year
2006
Journal title
Journal of Materials Science
Record number
830676
Link To Document