Author/Authors :
G. TOMANDL?، نويسنده , , M. MANGLER، نويسنده , , D. Stoyan، نويسنده , , A. Tscheschel، نويسنده , , TU BERGAKADEMIE FREIBERG، نويسنده , , J. GOEBBELS، نويسنده , , G. WEIDEMANN، نويسنده ,
Abstract :
In this paper the characterisation of functionally graded materials is elucidated by several
different methods. These methods described here are used for the quantitative analysis of
materials with a local dependence of microstructure parameters. Using X-ray microscopy
(computed tomography) for 3D-measurements and optical microscopy on polished sections for
1D and 2D measurements on the same sample, a ceramic filter consisting of sintered spherical
particles, various mathematical evaluation methods are described and compared.
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