Title of article
Study of defect states in a-Se85Te15–xPbx thin films by space charge limited conduction mechanism
Author/Authors
V. S. Kushwaha، نويسنده , , A. Kumar، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2007
Pages
5
From page
2712
To page
2716
Abstract
Current–Voltage (I–V) characteristics have
been studied at various temperatures in vacuum
evaporated thin films of a-Se85Te15–xPbx (x = 0, 2, 4, 6)
alloys. These characteristics show that, at low electric
fields, an ohmic behaviour is observed. However, at
high electric fields (E ~ 104 V/cm), the current becomes
superohmic. At high fields, in case of samples
having 0 and 2 at% of Pb, the experimental data fits
well with the theory of space charge limited conduction
(SCLC) in case of uniform distribution of localized
states in the mobility gap. Such type of behaviour is not
observed at higher concentration of Pb in the present
glassy system due to high conductivity. In these
samples, joule heating due to large currents may
prohibit the measurement of SCLC. Using the theory
of SCLC for the uniform distribution of the traps, the
density of localized defect states near Fermi level is
calculated for these compositions. The results indicate
that the density of defect states near Fermi level
increases on addition of Pb to binary Se85Te15alloy.
This is explained in terms of electronegativity of Pb as
compared to host elements.
Journal title
Journal of Materials Science
Serial Year
2007
Journal title
Journal of Materials Science
Record number
832696
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