Author/Authors :
Cabir Terzioglu، نويسنده , , Dincer Yegen، نويسنده , , Mustafa Yilmazlar، نويسنده , ,
Osman Gorur، نويسنده , , Mustafa Akdogan، نويسنده , , Ahmet Varilci، نويسنده ,
Abstract :
We have investigated the effect of Sm substitution
in Bi(Pb)SrCaCuO system by performing AC
susceptibility (v ¼ v0 þ iv00), XRD (X Ray Diffraction)
and SEM (Scanning Electron Microscopy) measurements.
The Sm fi Ca substitution (Bi1.6Pb0.4Sr2Ca2–x
SmxCu3Oy) was carried out by conventional solid-state
reaction method. The susceptibility measurements were
carried out at different values of the AC field amplitudes.
The imaginary part of susceptibility is used to
estimate the intergranular critical current density by
means of the Bean’s model. The intergranular critical
current density (Jc) of pure sample is found to be about
68 A/cm2 at 95 K. The intergranular Jc is seen to decrease
with increasing Sm substitution. XRD pattern
and SEM micrographs are given to provide information
about Bi-2223 phase and grain size respectively.