• Title of article

    Mechanical vs. electrical failure mechanisms in high voltage, high energy density multilayer ceramic capacitors

  • Author/Authors

    Amanda Lynn Young، نويسنده , , Gregory E. Hilmas، نويسنده , , Shi C. Zhang، نويسنده , , Robert W. Schwartz، نويسنده ,

  • Issue Information
    دوهفته نامه با شماره پیاپی سال 2007
  • Pages
    7
  • From page
    5613
  • To page
    5619
  • Abstract
    Causes of breakdown, both mechanical and electrical, in high voltage, high energy density, BaTiO3 capacitors were studied. The flexural strength of the capacitors was 96 MPa. Failure was due to surface defects or pores close to the surfaces of the samples. The dielectric breakdown strength of the samples was 181 kV/cm. The causes of breakdown were either electrode end effects or pores between the dielectric and electrode layers. Weibull statistics were used to determine if there was a correlation between mechanical failure and dielectric breakdown. A strong correlation between the two types of failure was not found in the study, in contrast to earlier studies of single dielectric layer capacitor materials.
  • Journal title
    Journal of Materials Science
  • Serial Year
    2007
  • Journal title
    Journal of Materials Science
  • Record number

    833081