Title of article
Mechanical vs. electrical failure mechanisms in high voltage, high energy density multilayer ceramic capacitors
Author/Authors
Amanda Lynn Young، نويسنده , , Gregory E. Hilmas، نويسنده , , Shi C. Zhang، نويسنده , , Robert W. Schwartz، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2007
Pages
7
From page
5613
To page
5619
Abstract
Causes of breakdown, both mechanical and
electrical, in high voltage, high energy density, BaTiO3
capacitors were studied. The flexural strength of the capacitors
was 96 MPa. Failure was due to surface defects or pores
close to the surfaces of the samples. The dielectric breakdown
strength of the samples was 181 kV/cm. The causes of
breakdown were either electrode end effects or pores between
the dielectric and electrode layers. Weibull statistics
were used to determine if there was a correlation between
mechanical failure and dielectric breakdown. A strong correlation
between the two types of failure was not found in the
study, in contrast to earlier studies of single dielectric layer
capacitor materials.
Journal title
Journal of Materials Science
Serial Year
2007
Journal title
Journal of Materials Science
Record number
833081
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