Title of article
Crystalline quality and phase purity of CVD diamond films studied by Raman spectroscopy
Author/Authors
W. Fortunato، نويسنده , , A. J. Chiquito، نويسنده , , J. C. Galzerani، نويسنده , , J. R. Moro، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2007
Pages
6
From page
7331
To page
7336
Abstract
Two series of diamond films grown—at different
temperatures—by two chemical vapor deposition
(CVD) methods, i.e., hot filament (HFCVD) and microwave-
plasma (MPCVD), were investigated. Raman spectroscopy
and scanning electron microscopy were employed
to perform a study of both crystalline quality and phase
purity of the films grown by the two techniques. It was
found that high phase purity can be attained by both
methods. However, at high temperatures, the MPCVD
technique produced films with higher crystalline quality as
compared to those grown by HFCVD. Finally, in order to
shed some light into the mechanisms responsible for the
lower crystalline quality observed in the HFCVD films, a
study based in the phonon confinement model and stress
was accomplished.
Journal title
Journal of Materials Science
Serial Year
2007
Journal title
Journal of Materials Science
Record number
833414
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