Title of article
Spectral and directional emittance of alumina at 823 K
Author/Authors
George Teodorescu، نويسنده , , PETER D. JONES، نويسنده ,
Issue Information
دوهفته نامه با شماره پیاپی سال 2008
Pages
5
From page
7225
To page
7229
Abstract
Spectral–directional emittance measurements
of aluminum oxide (99.5% pure), in air, were performed at
823 K using an apparatus comprised of a Fourier Transform
Infrared (FTIR) spectrometer, a blackbody radiating
cavity (hohlraum), and a sample holder which allows
directional measurements. The data cover a wide spectral
range between 2 and 25 lm, and a directional range from a
surface normal to a 72 polar angle. The aluminum oxide
sample used in the experiment had a nominal surface
roughness of 1 lm determined by a profilometer. Directional
emittance shows no departure from dielectric
behavior.
Journal title
Journal of Materials Science
Serial Year
2008
Journal title
Journal of Materials Science
Record number
834769
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