Determination of the Se Atom Distribution in the Layered Compound Nb3(Se1-xIx)I7 by Scanning Tunneling Microscopy

The layered compound Nb3(Se1-xIx)I7 is obtained when the I atoms at the face-capping sites of the layered compound Nb3I8 are replaced by Se atoms. The amount and distribution of the Se atoms in Nb3(Se1-xIx)I7 were examined by scanning tunneling microscopy. The analysis shows that the distribution of the Se atoms is completely random.