Title of article
Monte Carlo simulation of kinetic electron emission induced by MeV He+ and He++ ions incident on polycrystalline aluminium Original Research Article
Author/Authors
A Dubus، نويسنده , , M R?sler، نويسنده , , M. O. Benka-Coker، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
12
From page
37
To page
48
Abstract
A theoretical study of the characteristics of kinetic electron emission induced by He+ and He++ ions (in the MeV-range) incident on polycrystalline aluminium targets is presented in this paper. The models of interactions for the incident projectiles as well as for the excited electrons are described. Especially, the electron excitation induced by incident He+ is calculated by taking into account the structure of the composite projectile. Charge exchange processes by the projectiles are also considered. The subsequent electron transport and escape is calculated by means of a Monte Carlo simulation code. The calculated electron emission yield is compared to experimental results. The differences between He+ and He++ are discussed, the role of the electron lost by He+ being especially emphasised.
Keywords
Monte Carlo simulation , Particle induced electron emission
Journal title
Mathematics and Computers in Simulation
Serial Year
2001
Journal title
Mathematics and Computers in Simulation
Record number
853713
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