Title of article :
Testing for jumps in the EGARCH process Original Research Article
Author/Authors :
Xiuhong Shi، نويسنده , , Masahito Kobayashi، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2009
Pages :
12
From page :
2797
To page :
2808
Abstract :
This paper considers testing for jumps in the exponential GARCH (EGARCH) models with Gaussian and Student-t innovations. The Wald and log likelihood ratio tests contain a nuisance parameter unidentified under the null hypothesis of no jumps, and hence are unavailable for this problem, because jump probability and variance of jumps in the test statistic cannot be estimated under the null hypothesis of no jumps. It is shown that the nuisance parameter is cancelled out in the Lagrange multiplier (LM) test statistic, and hence that the test is nuisance parameter-free. The one-sided test is also proposed using the nonnegative constraint on jump variance. The actual size and power of the tests are examined in a Monte Carlo experiment. The test is applied to daily returns of S&P 500 as an illustrative example.
Keywords :
Diracיs delta function , Jump process , Lagrange Multiplier test , Davies Problem , Exponential GARCH
Journal title :
Mathematics and Computers in Simulation
Serial Year :
2009
Journal title :
Mathematics and Computers in Simulation
Record number :
854740
Link To Document :
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