Title of article :
Total ionizing dose effects in MOS oxides and devices
Author/Authors :
T.R.، Oldham, نويسنده , , F.B.، McLean, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
This paper reviews the basic physical mechanisms of the interactions of ionizing radiation with MOS oxides, including charge generation, transport, trapping and detrapping, and interface trap formation. Device and circuit effects are also discussed briefly.
Keywords :
Determination , Continuous , Biodegradable dissolved organic carbon , Cell immobilization , bioreactor
Journal title :
IEEE Transactions on Nuclear Science
Journal title :
IEEE Transactions on Nuclear Science
