Title of article
A single event latchup suppression technique for COTS CMOS ICs
Author/Authors
J.C.، Pickel, نويسنده , , J.P.، Spratt, نويسنده , , R.E.، Leadon, نويسنده , , R.C.، Lacoe, نويسنده , , S.C.، Moss, نويسنده , , S.D.، LaLumondiere, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-2218
From page
2219
To page
0
Abstract
Results are presented on technique using displacement damage from energetic ions to suppress single event latchup in commercial off-the-shelf (COTS) CMOS integrated circuits. Ions implanted through the back of a thinned chip degrade the parasitic bipolar transistors causing latchup without degrading chip functionality or the parametrics of the chip.
Keywords
Biodegradable dissolved organic carbon , Determination , Continuous , bioreactor , Cell immobilization
Journal title
IEEE Transactions on Nuclear Science
Serial Year
2003
Journal title
IEEE Transactions on Nuclear Science
Record number
86329
Link To Document