• Title of article

    Using a system-level bit-error-rate model to predict on-orbit performance

  • Author/Authors

    M.A.، Cosgrove, نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -2351
  • From page
    2352
  • To page
    0
  • Abstract
    Component single-event upset (SEU) rates are used to model and predict system bit-error rate (BER) performance in trade and specification verification analyses. Simplifying trade studies involving component cost, delivery-time reductions, and part substitution effects are important benefits.
  • Keywords
    Biodegradable dissolved organic carbon , Cell immobilization , bioreactor , Continuous , Determination
  • Journal title
    IEEE Transactions on Nuclear Science
  • Serial Year
    2003
  • Journal title
    IEEE Transactions on Nuclear Science
  • Record number

    86354

    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=10&DC=86354