The two-layer Ising film correlation length and critical curve by CLE and CVM methods

On the basis of an improved elaboration of the method already proposed by the present authors, the correlation length along a vertical section of a two-layer ferromagnetic Ising film is calculated for all T Tc. As a by-product the critical curve is determined and a very interesting factorization property, related to scaling limits, is pointed out. A comparison is made with previous results from other methods.