Title of article
X-ray scattering studies of crystallization, growth and wetting phenomena at surfaces
Author/Authors
S. K. Sinha، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1996
Pages
13
From page
140
To page
152
Abstract
X-ray scattering has proven to be a very powerful probe in investigating the structure and morphology of surfaces, interfaces and thin films. In this paper, we review some recent applications of the technique to study phenomena such as the scaling properties of films growing on a substrate, surface crystallization phenomena in hydrocarbons, and the wetting of inhomogeneous surfaces by liquid films.
Journal title
Physica A Statistical Mechanics and its Applications
Serial Year
1996
Journal title
Physica A Statistical Mechanics and its Applications
Record number
863969
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