Simple model for the linear temperature dependence of the electrical resistivity of layered cuprates

The thermal fluctuations of the electric field between the CuO2 planes of layered cuprates are considered as an origin of the electrical resistivity. The model evaluation employs a set of separate plane capacitors each having an area equal to the squared in-plane lattice constant a02. It is shown that the scattering of charge carriers by the fluctuation of electric charge in the conducting CuO2 planes gives rise to the in-plane electrical resistivity ρab. Such a mechanism can be viewed as an analog of the Rayleighʹs blue-sky law – the charge carriers are scattered by thermal fluctuations of electron density.