Title of article
Trends and Challenges in VLSI Circuit Reliability
Author/Authors
Constantinescu، Cristian نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2003
Pages
-13
From page
14
To page
0
Abstract
Deep-submicron technology is having a significant impact on permanent, intermittent, and transient classes of faults. This article discusses the main trends and challenges in circuit reliability, and explains evolving techniques for dealing with them.
Keywords
photonics , Application
Journal title
IEEE MICRO
Serial Year
2003
Journal title
IEEE MICRO
Record number
90225
Link To Document