Title of article :
Benefits of a SoC-specific test methodology
Author/Authors :
M.S.، Quasem, نويسنده , , Jiang، Zhigang نويسنده , , S.K.، Gupta, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
The tradeoff between IP protection and SoC-level test optimization has been an issue for some time. The more IP providers protect their IP, the less flexibility system developers have to control test costs and fault coverage. In this paper, a new approach dynamically extracts IPrelated test information or optimizing SoC testing without jeopardizing IP protection.
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers