Title of article :
Solving satisfiability in combinational circuits
Author/Authors :
J.، Marques-Silva, نويسنده , , L.، Guerra e Silva, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-15
From page :
16
To page :
0
Abstract :
As EDA evolves, researchers continue to find modeling tools to solve problems of test generation, design verification, logic, and physical synthesis, among others. One such modeling tool is Boolean satisfiability (SAT), which has very broad applicability in EDA. The authors review modern SAT algorithms, show how these algorithms can account for structural information in combinational circuits, and explain what recursive learning can add to SAT.
Keywords :
leukemia
Journal title :
IEEE Design and Test of Computers
Serial Year :
2003
Journal title :
IEEE Design and Test of Computers
Record number :
90286
Link To Document :
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