Title of article :
Achieving at-speed structural test
Author/Authors :
S.، Pateras, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
In addition to structural test, BIST offers an alternative low-cost approach to at-speed testing. How should BIST be implemented to address at-speed testing? What issues remain to be solved? How can we deal with multicycle paths and different frequency domains? The author describes BIST implementation techniques to answer these questions.
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers