Title of article :
Boundary scan test standards
Author/Authors :
P.J.، Ashenden, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
I give an overview of several standards defining test technology based on boundary scan. The Test Technology Technical Council (MC), an IEEE Computer Society technical committee, sponsors these standards.
Keywords :
Intersubband transitions , nonlinear optics , Second-harmonic generation , quantum cascade laser , Quantum wells , mid-infrared , multiple-wavelength emission
Journal title :
IEEE Design and Test of Computers
Journal title :
IEEE Design and Test of Computers
