Material characterization using a quasi-optical measurement system

The application of a quasi-optical apparatus in the determination of the relative permittivity of low-loss dielectric materials is presented in this paper. A description of the measurement system and its components is provided. Correction terms are introduced to remove errors due to the position tolerance of the sample and the calibration procedure. Two numerical methods are used to determine the relative permittivity from reflection and transmission coefficients. Good agreement was observed between corrected results obtained with the quasioptical measurement system and measurements performed by an independent standards testing organization.