Author/Authors :
P.، Warnecke, نويسنده , , G.، Rietveld, نويسنده , , Ch.V.، Koijmans, نويسنده , , L.C.A.، Henderson, نويسنده , , M.J.، Hall, نويسنده , , S.، Harmon, نويسنده , , B.، Schumacher, نويسنده ,
Abstract :
A new methodology for conductivity measurements, where square metallic samples are measured with the Van der Pauw technique, has been successfully implemented. The uncertainty obtained is 0.04% and a comparison between national metrology institutes gives an agreement of the measurement values within 0.035%. Major advantages of the new method are that smaller reference samples are required and only a single dimensional measurement is needed.
