Rapid amplitude and group-delay measurement system based on intra-cavity-modulated swept-lasers

In this paper, we present a high-speed wavelength-swept laser for application in a real-time optical device characterization system. The system is capable of simultaneous measurement of both the spectral amplitude and group-delay responses of the device-under-test, at a scan rate of 22 Hz over a wide wavelength range of 50 nm. This corresponds to a record sweep rate of >1000 nm/s.