Title of article
Detected contrast and dynamic range measurements of CdZnTe semiconductors for flat-panel digital radiography
Author/Authors
F.، Russo, نويسنده , , G.C.، Giakos, نويسنده , , R.، Guntupalli, نويسنده , , N.، Shah, نويسنده , , S.، Vedantham, نويسنده , , S.، Suryanarayanan, نويسنده , , S.، Chowdhury, نويسنده , , N.، Patnekar, نويسنده , , S.، Sumrain, نويسنده , , K.، Mehta, نويسنده , , R.، Nemer, نويسنده , , A.G.، Passerini, نويسنده , , K.، Nataraj, نويسنده , , E.A.، Evans, نويسنده , , R.، Endorf, نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 2001
Pages
-1603
From page
1604
To page
0
Abstract
The detected contrast and dynamic ranges of Cd1-xZnxTe semiconductor detectors have been measured, within the X-ray diagnostic energy range, using a contrast sensitivity phantom. The aim of this study is to optimize the image quality parameters of these solid state ionization devices for flat panel digital radiographic applications. The experimental results of this study indicate that Cd1-xZnxTe detectors have excellent detected contrast response and large dynamic range
Keywords
Hydrograph
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Serial Year
2001
Journal title
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Record number
91945
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