Title of article :
A generalized Conforming Run Length control chart for monitoring the mean
of a variable
Author/Authors :
Zhang Wua، نويسنده , , *، نويسنده , , Zhaojun Wang، نويسنده , , Wei Jiang c، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2010
Abstract :
The attribute Conforming Run Length (CRL) control chart has attracted increasing research interests in
Statistical Process Control (SPC). It decides the process status based on the interval or distance between
two nonconforming units. This article proposes a Generalized CRL chart (namely GCRL chart) for monitoring
the mean of a measurable quality characteristic x under 100% inspection. To run a GCRL chart, each
unit will be classified as a passing or nonpassing unit depending on whether the sample value of x falls
within or beyond a pair of lower and upper inspection limits LIL and UIL. When a nonpassing unit is
detected, the GCRL chart checks the distance between the current and last nonpassing units in order
to determine the process status (in control or out of control). The inspection limits LIL and UIL are determined
by an optimization design. The GCRL chart not only solves a dead-corner problem suffered by the
conventional CRL chart, but also considerably outperforms the latter for detecting mean shifts. The most
interesting finding is that the attribute GCRL chart excels the variable X chart to a significant degree in
SPC for variables. It suggests that the simple attribute chart may replace the variable chart in some
SPC applications. The design of the GCRL chart has to be carried out by a computer program, but the
design can be completed almost in no time in a personal computer.
Keywords :
Attribute inspections , Conforming Run Length , Statistical process control , CRL control chart , Quality control
Journal title :
Computers & Industrial Engineering
Journal title :
Computers & Industrial Engineering