• Title of article

    Notes on shift effects for T2-type charts on multivariate ARMA residuals

  • Author/Authors

    Xia Pan، نويسنده ,

  • Issue Information
    ماهنامه با شماره پیاپی سال 2005
  • Pages
    12
  • From page
    381
  • To page
    392
  • Abstract
    Statistical process control (SPC) needs to be aided by computers in order to deal with dynamic systems. Hence, more knowledge on the complexity of this issue is needed. This paper discusses in general the shift effects of residuals from vector autoregressive moving average process for Shewhart-type, i.e. Hotelling T2-type charts (we call it H charts). Three types of parameter shift were considered: mean shift, covariance shift, and coefficient shift. The estimation effects were addressed. The discussions begin with the shift effects for residuals then for T2-type chart on residuals. The out-of-control distributions of the chart statistic were provided in this paper.
  • Keywords
    residual charts , Vector ARMA , SPC , Shift effects
  • Journal title
    Computers & Industrial Engineering
  • Serial Year
    2005
  • Journal title
    Computers & Industrial Engineering
  • Record number

    926587