Title of article :
Minimizing total weighted tardiness on a single batch process machine with incompatible job families
Author/Authors :
Imelda C. Perez، نويسنده , , John W. Fowler، نويسنده , , W. Matthew Carlyle، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2005
Pages :
15
From page :
327
To page :
341
Abstract :
The diffusion step in semiconductor wafer fabrication is very time consuming, compared to other steps in the process, and performance in this area has a significant impact on overall factory performance. Diffusion furnaces are able to process multiple lots of similar wafers at a time, and are therefore appropriately modeled as batch processing machines with incompatible job families. Due to the importance of on-time delivery in semiconductor manufacturing, we focus on minimizing the total weighted tardiness in this environment. The resulting problem is NP-Hard, and we decompose it into two sequential decision problems: assigning lots to batches followed by sequencing the batches. We develop several heuristics for these subproblems and test their performance.
Journal title :
Computers and Operations Research
Serial Year :
2005
Journal title :
Computers and Operations Research
Record number :
928170
Link To Document :
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