• Title of article

    Optimized resistivity of p-type Si substrate for HIT solar cell with Al back surface field by computer simulation

  • Author/Authors

    L. Zhao *، نويسنده , , H.L. Li، نويسنده , , C.L. Zhou، نويسنده , , H.W. Diao، نويسنده , , W.J. Wang، نويسنده ,

  • Issue Information
    ماهنامه با شماره پیاپی سال 2009
  • Pages
    5
  • From page
    812
  • To page
    816
  • Abstract
    For HIT (heterojunction with intrinsic thin-layer) solar cell with Al back surface field on p-type Si substrate, the impacts of substrate resistivity on the solar cell performance were investigated by utilizing AFORS-HET software as a numerical computer simulation tool. The results show that the optimized substrate resistivity (Rop) to obtain the maximal solar cell efficiency is relative to the bulk defect density, such as oxygen defect density (Dod), in the substrate and the interface defect density (Dit) on the interface of amorphous/crystalline Si heterojunction. The larger Dod or Dit is, the higher Rop is. The effect of Dit is more obvious. Rop is about 0.5 X cm for Dit = 1.0 1011/cm2, but is higher than 1.0 X cm for Dit = 1.0 1012/cm2. In order to obtain very excellent solar cell performance, Si substrate, with the resistivity of 0.5 X cm, Dod lower than 1.0 1010/cm3, and Dit lower than 1.0 1011/cm2, is preferred, which is different to the traditional opinion that 1.0 X cm resistivity is the best. 2008 Elsevier Ltd. All rights reserved
  • Keywords
    simulation , Substrate resistivity , HIT solar cell
  • Journal title
    Solar Energy
  • Serial Year
    2009
  • Journal title
    Solar Energy
  • Record number

    940078