Title of article :
Optimized resistivity of p-type Si substrate for HIT solar cell with Al back surface field by computer simulation
Author/Authors :
L. Zhao *، نويسنده , , H.L. Li، نويسنده , , C.L. Zhou، نويسنده , , H.W. Diao، نويسنده , , W.J. Wang، نويسنده ,
Issue Information :
ماهنامه با شماره پیاپی سال 2009
Pages :
5
From page :
812
To page :
816
Abstract :
For HIT (heterojunction with intrinsic thin-layer) solar cell with Al back surface field on p-type Si substrate, the impacts of substrate resistivity on the solar cell performance were investigated by utilizing AFORS-HET software as a numerical computer simulation tool. The results show that the optimized substrate resistivity (Rop) to obtain the maximal solar cell efficiency is relative to the bulk defect density, such as oxygen defect density (Dod), in the substrate and the interface defect density (Dit) on the interface of amorphous/crystalline Si heterojunction. The larger Dod or Dit is, the higher Rop is. The effect of Dit is more obvious. Rop is about 0.5 X cm for Dit = 1.0 1011/cm2, but is higher than 1.0 X cm for Dit = 1.0 1012/cm2. In order to obtain very excellent solar cell performance, Si substrate, with the resistivity of 0.5 X cm, Dod lower than 1.0 1010/cm3, and Dit lower than 1.0 1011/cm2, is preferred, which is different to the traditional opinion that 1.0 X cm resistivity is the best. 2008 Elsevier Ltd. All rights reserved
Keywords :
simulation , Substrate resistivity , HIT solar cell
Journal title :
Solar Energy
Serial Year :
2009
Journal title :
Solar Energy
Record number :
940078
Link To Document :
بازگشت