Title of article :
Characterizing defect n-extendable graphs and image-critical graphs Original Research Article
Author/Authors :
Xuelian Wen، نويسنده , , Dingjun Lou، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2008
Pages :
6
From page :
5064
To page :
5069
Keywords :
Near perfect matching , Defect nn-extendable graph , (2n+1)(2n+1)-Critical graph , M-alternating path
Journal title :
Discrete Mathematics
Serial Year :
2008
Journal title :
Discrete Mathematics
Record number :
947127
Link To Document :
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