Title of article :
On the optimal parameter choice for (nu)-support vector machines
Author/Authors :
I.، Steinwart, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
We determine the asymptotically optimal choice of the parameter (nu) for classifiers of (nu)-support vector machine ((nu)-SVM) type which has been introduced by Scholkopf et al. (2000). It turns out that (nu) should be a close upper estimate of twice the optimal Bayes risk provided that the classifier uses a so-called universal kernel such as the Gaussian RBF kernel. Moreover, several experiments show that this result can be used to implement some modified cross validation procedures which improve standard cross validation for (nu)-SVMs.
Keywords :
developable surface , Physical optics , electromagnetic scattering , radar backscatter
Journal title :
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE
Journal title :
IEEE TRANSACTIONS ON PATTERN ANALYSIS AND MACHINE INTELLIGENCE