• Title of article

    An analysis of small-signal gate-drain resistance effect on RF power MOSFETs

  • Author/Authors

    Lu، Shey-Shi نويسنده , , Lin، Yo-Sheng نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 2003
  • Pages
    -524
  • From page
    525
  • To page
    0
  • Abstract
    The anomalous dip in scattering parameter S/sub 11/ of RF power MOSFETs with drain-to-spacer offset is explained quantitatively for the first time. Our results show that, for RF power MOSFETs, the input impedance can be represented by a simple series RC circuit at low frequencies and a "shifted" parallel RC circuit at high frequencies. The appearance of the anomalous dip of S/sub 11/ in a Smith chart is caused by this inherent ambivalent characteristic of the input impedance. It is found that an increase of drain-to-spacer offset enhances the anomalous dip. In addition, the anomalous dip in S/sub 11/ of RF power n-MOSFETs can also be interpreted in terms of poles and zeros.
  • Keywords
    Industrial organization , Biotechnology R&D
  • Journal title
    IEEE TRANSACTIONS ON ELECTRON DEVICES
  • Serial Year
    2003
  • Journal title
    IEEE TRANSACTIONS ON ELECTRON DEVICES
  • Record number

    95789