CMOS APS crosstalk characterization via a unique submicron scanning system

This work introduces a novel way for CMOS APS crosstalk (CTK) determination and prediction based on our unique Submicron Scanning System (SSS) measurements. It enables the crosstalk magnitude determination, the tracking of its main causes, and can be used as a predictive tool for design optimization. A pronounced crosstalk asymmetry within the array which was revealed by the measurements is analyzed and modeled. The result points out that CMOS APS crosstalk is mostly affected by the specific pixel architecture and the pixels arrangement within the array.