Title of article :
A physical compact model of DG MOSFET for mixed-signal circuit applications - part II: Parameter extraction
Author/Authors :
Pei، Gen نويسنده , , E.C.-C.، Kan, نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-2143
From page :
2144
To page :
0
Abstract :
For pt. see ibid., vol. 50, no. 10, p. 2135 (2003). Based on the physical double-gate MOSFET model described in Part I, we present a systematic parameter extraction methodology that avoids parameter interdependence between different physical effects whenever possible. Several extraction schemes are compared for precise modeling of small-signal and large-signal characteristics. The physical model and the extraction methodology are verified through the reproduction of the simulated drain current, incremental drain resistance, and transconductance per unit current, which are parameters of particular interest to mixed-signal circuit designs.
Keywords :
channel hot electron (CHE) , channel initiated secondary electron (CHISEL) , device scaling , Flash electrically erasable programmable read-only memories (EEPROMs) , hot carriers , Monte Carlo simulation , programming efficiency
Journal title :
IEEE TRANSACTIONS ON ELECTRON DEVICES
Serial Year :
2003
Journal title :
IEEE TRANSACTIONS ON ELECTRON DEVICES
Record number :
95913
Link To Document :
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