Title of article :
Traveling-wave tube cold-test circuit optimization using CST MICROWAVE STUDIO
Author/Authors :
J.D.، Wilson, نويسنده , , C.T.، Chevalier, نويسنده , , C.L.، Kory, نويسنده , , E.G.، Wintucky, نويسنده , , Jr.، Dayton, J.A., نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Abstract :
The internal optimizer of CST MICROWAVE STUDIO (MWS) was used along with an application-specific Visual Basic for Applications (VBA) script to develop a method to optimize traveling-wave tube (TWT) cold-test circuit performance. The optimization procedure allows simultaneous optimization of circuit specifications including on-axis interaction impedance, bandwidth or geometric limitations. The application of MWS to TWT cold-test circuit optimization is described below.
Keywords :
channel hot electron (CHE) , device scaling , Flash electrically erasable programmable read-only memories (EEPROMs) , Monte Carlo simulation , programming efficiency , channel initiated secondary electron (CHISEL) , hot carriers
Journal title :
IEEE TRANSACTIONS ON ELECTRON DEVICES
Journal title :
IEEE TRANSACTIONS ON ELECTRON DEVICES
