Title of article :
Genetic algorithms applied to optimal tolerance levels of multiattribute inspection errors
Author/Authors :
Sohn، Young-Jong نويسنده , , Moon، Hyoung Uk نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 2003
Pages :
-337
From page :
338
To page :
0
Abstract :
In modern manufacturing environment, inspection equipment often can deal with more than one quality characteristic simultaneously. At the design stage of such inspection equipment, it is necessary to identify optimal combination of inspection error tolerance levels of multiattributes. We suggest a genetic algorithm by which one can determine the optimal tolerance levels of errors for multiinspection attributes at a minimum cost of ownership (COO). The COO model is formulated as a function of not only the initial purchase cost but also the inspection cost over lifetime. Our approach is expected to effectively contribute to marketing as well as manufacturing of inspection equipment.
Keywords :
Reflectance measurements , corn , Crop N monitoring , Nitrogen deficiency
Journal title :
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING
Serial Year :
2003
Journal title :
IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING
Record number :
97255
Link To Document :
بازگشت