Title of article
Atomic layer epitaxy growth of doped zinc oxide thin films from organometals
Author/Authors
Vesa Lujala، نويسنده , , Jarmo Skarp، نويسنده , , Markku Tammenmaa، نويسنده , , Tuomo Suntola، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1994
Pages
7
From page
34
To page
40
Abstract
An atomic layer epitaxy process for growing Al-doped ZnO thin films is presented. Organometallic precursors of zinc and aluminum were used to react with water at substrate temperatures of 120–350°C. Growth rate varied from 0.5 to 2.5 Å/cycle, depending on precursors and substrate temperatures used. With optimum doping, sheet resistances of 10 Ω/□ with 1 μm thick films were obtained.
Journal title
Applied Surface Science
Serial Year
1994
Journal title
Applied Surface Science
Record number
989775
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