Title of article
A multitechnique analysis of the outermost layers of the Teflon PFA surface
Author/Authors
K. Piyakis، نويسنده , , E. Sacher، نويسنده , , A. Domingue، نويسنده , , J.-J. Pireaux، نويسنده , , G. Leclerc، نويسنده , , P. Bertrand، نويسنده , , J.B. Lhoest، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
9
From page
227
To page
235
Abstract
Fluoropolymers are notoriously difficult to metallize. In order to ascertain the role of the substrate surface, the surface chemical structure of a representative fluoropolymer has been determined. Three techniques have been used to study the outer surfaces of the extruded fluoropolymer film, Teflon PFA. These techniques are: high-resolution electron energy-loss spectroscopy, phase-sensitive photoacoustic Fourier-transform infrared spectroscopy and time-of-flight secondary ion mass spectroscopy. These complementary techniques confirm that the extrusion process introduces a small amount of outer surface contamination, probably through the reaction of the hot extrudate with the atmosphere immediately on exiting the film-forming die.
Journal title
Applied Surface Science
Serial Year
1995
Journal title
Applied Surface Science
Record number
989888
Link To Document