Title of article
VEPFIT applied to depth profiling problems
Author/Authors
A. van Veen، نويسنده , , H. Schut، نويسنده , , M. Clement، نويسنده , , J.M.M. de Nijs، نويسنده , , A. Kruseman، نويسنده , , M.R. Ijpma، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
9
From page
216
To page
224
Abstract
The modelling and fitting program VEPFIT has been employed in recent years for resolving defect depth profiles and depth structures of deposited layers. Recent activities concerning program development include the testing of a new model of MOS systems for implementation into VEPFIT and a study into decomposition of Doppler-broadened photo-peaks. Further methods are proposed using VEPFIT for analysis of lifetime measurements and for modelling of positron transport with multi-energy groups.
Journal title
Applied Surface Science
Serial Year
1995
Journal title
Applied Surface Science
Record number
989946
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