Title of article
APFIM investigations on ordered γ-TiAl using single-layer detection method
Author/Authors
J. Wesemann، نويسنده , , G. Frommeyer، نويسنده , , M. Kreuss، نويسنده ,
Issue Information
روزنامه با شماره پیاپی سال 1995
Pages
6
From page
179
To page
184
Abstract
The defect structure in the γ-phase of an α2γ-Ti51Al46Cr3 alloy and the site occupation of chromium has been studied using atom-probe field-ion microscopy (APFIM). Because of the difficult separation of adjacent atomic layers during conventional APFIM measurements a video-controlled field-evaporation technique was carried out. The γ-phase is hyperstoichiometric in aluminium. Many Al antistructure atoms were detected in Ti layers but no Ti antistructure atoms were found in Al layers. Chromium has a strong preference for occupying Ti sites in the ordered γ-phase (L10 type of superlattice). This seems to be in contrast with the results obtained by ALCHEMI (atom location by channelling-enhanced microanalysis). However, this discrepancy can be explained with the dependence of the site preference of chromium on the local Al concentration.
Journal title
Applied Surface Science
Serial Year
1995
Journal title
Applied Surface Science
Record number
990093
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