Quantitative analysis of individual atom images in FIM of an ordered Ni4Mo alloy

Quantitative measurements of the position and intensity of individual atom images in field ion microscopy of an ordered Ni4Mo alloy were made successfully. The accuracy of the atom positions in the image was investigated. Intensity distributions especially for low intensity regions around individual atoms were demonstrated successfully by both contour maps and a perspective view. The effects of the geometry and surrounding atoms were discussed.