Title of article :
XPS investigations of the interactions of hydrogen with thin films of zirconium oxide I. Hydrogen treatments on a 10 Å thick film
Author/Authors :
P.C. Wong، نويسنده , , Y.S. Li، نويسنده , , M.Y. Zhou، نويسنده , , K.A.R. Mitchell، نويسنده ,
Issue Information :
روزنامه با شماره پیاپی سال 1995
Pages :
7
From page :
255
To page :
261
Abstract :
Interactions of hydrogen with the interface formed between ZrO2 and zirconium suboxide (ZrOx, x < 2) were studied on a 10 Å zirconium oxide film prepared on gold foil for X-ray photoelectron spectroscopy (XPS) analysis. This film was subject to a set of sequential treatments. Reaction with H2 gas at 2 mbar pressure and room temperature indicates that the ZrO2ZrOx interface appeared to undergo a redox-type reaction and convert to a new ZrO2ZrOy (x
Journal title :
Applied Surface Science
Serial Year :
1995
Journal title :
Applied Surface Science
Record number :
990163
Link To Document :
