XPS, AES and LEED studies of Cu deposited on Cr2O3(0001) surfaces

The interaction between ultrathin layers of Cu and Cr2O3(0001) surfaces was studied by X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy and low-energy electron diffraction (LEED). The XPS results indicate that copper deposited on the Cr2O3(0001) surfaces is initially in a Cu(I) state, and an agglomeration of copper on the Cr2O3(001)-1 × 1 surface was seen with increasing copper coverage. A Cu(111)R30°Cr2O3(0001)-1 × 1 epitaxial relationship was observed by LEED.