Deposition of fluoropolymer thin films containing semiconductor microcrystallites by VUV laser ablation

Combining deposition of crystalline thin films of polytetrafluoroethylene (PTFE) via F2 laser (157 nm) ablation with CdTe microcrystallites synthesis in sizes of 3–7 nm via KrF laser (248 nm) ablation, CdTe microcrystallites-doped PTFE thin films were fabricated. The X-ray photoemission spectra show that the main architecture of PTFE and CdTe is maintained in the doped films. CdTe microcrystallites doped in PTFE matrix show an absorption edge shift toward higher energy region and a third-order optical nonlinearity, which are induced by the quantum size effect.