Author/Authors :
Alfons Ritzer، نويسنده , , B. Falkner، نويسنده , , S.T. Li، نويسنده , , D. B?uerle، نويسنده ,
Abstract :
Reflectivity measurements have been used to monitor the temporal evolution of the surface morphology during in-situ growth of Bi2Sr2CaCu2O8+δ films on (100)MgO by pulsed-laser deposition (PLD). Two regimes with different surface roughnesses can be distinguished. During deposition of the first few lattice constants reflectivity is shown to be sensitive to changes in deposition temperature near the decomposition limit.
