• Title of article

    Comparison of AES chemical shifts with XPS chemical shifts

  • Author/Authors

    Tetsu Sekine، نويسنده , , Nobuyuki Ikeo، نويسنده , , Yuji Nagasawa، نويسنده ,

  • Issue Information
    روزنامه با شماره پیاپی سال 1996
  • Pages
    6
  • From page
    30
  • To page
    35
  • Abstract
    Scanning Auger microprobe equipped with a concentric hemispherical analyzer allows us to measure AES spectra with high-energy resolution. The question is the extent of chemical state information obtainable by AES. XPS chemical shifts and AES chemical shifts, derived from transition energies available from literature, have been compared for many compounds. The mean values were found to be for peak shift 1.71 eV in the case of XPS and −3.86 eV for AES, and the standard deviations were 2.38 eV for XPS and 3.62 eV for AES. We found that the chemical shifts in AES were generally 1.5 times larger than in XPS. For some elements such as Fe, Co, Ni, and Cu, the AES chemical shifts are exceptionally small, but the peak shapes differ depending on the chemical states.
  • Journal title
    Applied Surface Science
  • Serial Year
    1996
  • Journal title
    Applied Surface Science
  • Record number

    990751